Page not found
Sorry, the page was not found. Please leave us a message.
- Products
- Materials science
- Systems to measure physical properties
- Magnetometers
- Nanoindenters - Nanohardness tester
- Photo lithography systems
- Furnace for crystal fabrication
- Spin coater
- Flexus thin film stress measurement systems
- FP profiler for large format samples
- Confocal Raman microscopes
- Atomic force microscopes for research
- Spectroscopic ellipsometers
- QCM-D Quartz Crystal Microbalance
- Spectroscopy
- Imaging
- Cameras and detectors for time-resolved imaging and spectroscopy
- Cameras for EUV, X-ray and high-energy particle detection
- CCD, EMCCD and sCMOS cameras for imaging
- Highest speed cameras
- High-end thermography cameras
- X-ray analytical instrumentation
- Atomic force microscopes for research
- Combined microscopes
- Confocal Raman microscopes
- Light measurement
- RISE microscopy
- Scanning nearfield optical microscopes (SNOM)
- Electron microscopy
- Cryogenics
- Optics
- Colored glass filters & sets
- Wire-grid polarizer UV-IR
- Quartz lenses & glass lenses
- Beamsplitters
- Bandpass filters
- Filters for fluorescence and Raman spectroscopy
- Neutral density filters
- Short and longpass filters
- Astronomy/UVBRI filters
- Heat control filters
- Dichroic filters & sets
- Infrared filters
- Filter accessories
- Light & lasers
- Life sciences
- Atomic force microscopes for research
- Combined microscopes
- Confocal Raman microscopes
- Filters for fluorescence analytics
- High-throughput cellular imagers
- Optical tweezers
- QCM-D Quartz Crystal Microbalance
- RISE microscopy
- Scanning nearfield optical microscopes (SNOM)
- Light sources for scientific applications
- Materials science
- Service
- News
- About us
Follow us: 
European offices
© LOT Quantum Design 2016